Lifetime free upgrades | Quick response service
Analysis elements: P(No.15)~U(No.92)
Analyze 4-layer coatings.
Measure the thickness and composition of coatings.
Test sample: coating/metal/liquid
Precision:
Coating: RSD≤1.5%
Precious metal: ±0.01% (9999 gold)
Liquid: RSD≤1.5%
Comply with ISO3497 and ASTM-B568.
Visible samples with lead glass
Nova is an X-ray fluorescence spectrometer developed by PURERAY Instrument for the non-destructive coating analysis. It can be widely used in various industries, such as the electroplating, chemical plating, connector and PCB. The analyzer adopts a USA AMPTEK customized Fast-SDD detector, an embedded computer with a 12-core CPU and the Smart FP algorithm. Without standard samples, the spectrometer can measure the thickness and composition of coatings at the same time. It can fast and accurately analyze 4-layer coatings.
| Detector | USA AMPTEK customized Fast-SDD | Collimator | Φ0.5mm(Optional) |
|---|---|---|---|
| Detector area: 25mm2 | Input Voltage | AC100～240V，50Hz | |
| Resolution: 125±5eV | Package size | 625*560*480mm | |
| Embedded computer | Intel i5 12-core | Machine size | 460*522*368mm |
| HV power supply | 50KV/1mA digital HV | Test chamber size | 374*344*155mm |
| X-ray tube | 50KV/1mA | Rated power | 150W |
| Window material: beryllium | Gross weight | 57KG | |
| Target material: wolfram/molybdenum | Net weight | 42KG | |
| Focus: Φ0.1mm | Noise | ＜65dB |
